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Edge and Interface Resistances Create Distinct Trade-Offs When Optimizing the Microstructure of Printed van der Waals Thin-Film Transistors
https://doi.org/10.18126/e9d0-pc68
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Description
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Raw experimental data, and Python notebooks for data analysis and device simulation.
Zhehao Zhu
Joon-Seok Kim
Michael J. Moody
Lincoln J. Lauhon
Zhehao Zhu (zhehaozhu2022@u.northwestern.edu)
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Lincoln Lauhon (lauhon@northwestern.edu)
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DOI registered
March 19, 2023
via DataCite
Dataset published 2023 in
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