99 Views 9 Downloads
Sorghum leaf blight and northern corn leaf blight, both caused by
Exserohilum turcicum, are major diseases of sorghum and maize,
respectively. Examining the genetic architecture of resistance in sorghum
will lead to a better understanding of the relationship between resistance
in sorghum and maize, which can ultimately enhance management options in
both crops. In 2018 and 2019 we evaluated two sorghum recombinant inbred
line (RIL) populations for resistance to E. turcicum. The BTx623 x IS3620C
and BTx623 x SC155 populations consisted of 235 and 81 RILs, respectively.
Resistance in both populations was moderately to highly heritable. We
identified a total of six quantitative trait loci (QTL) across the two
populations. Three QTL with small to moderate effect sizes were identified
in the BTx623 x IS3620C population. Three QTL, including a large-effect
QTL on chromosome three that explained 24% of the variation, were
identified in the BTx623 x SC155 population. We compared the identified
QTL with the position of northern corn leaf blight candidate genes and
found eight candidate resistance gene orthologs that colocalize with the
sorghum leaf blight QTL. There were also several nucleotide-binding
leucine rich repeat encoding genes within the candidate intervals.
Understanding host resistance in multiple species furthers our
understanding of the Exserohilum turcicum pathosystem.
99 views reported since publication in 2022.