The supplementary material includes description of the materials section(materials, inks preparation, device fabrication, laser patterning cycle, characterization), SEM images of the patterned multilayer device structures, photo-images of the PPDs, AFM and SEM images of the edge regions in PPDs, EDX elemental maps for the samples, measured IV characteristics, calculated Jphoto/Jdark ratio for various P0, comparison of the PPDs' output performance with the actual state-of-the-art results, the evolution of dark IV parameters of PPDs and transient response after storage in ambient conditions and ON/OFF cycles.