1 Citation
FIG S-2: SEM images of different steps during the cross-sectional lamella preparation. (a) protection layers are placed on top and at the
bottom of the planar lamella as stabilization. (b) the lamella after FIB milling before lift-out. (c) manipulators during the in-situ lift-out
procedure. (d) STEM overview image of the final sample after polishing.